Home Technologies About Us News Payment Contact Us
 
 
Products
Optical Instruments
Optics / Physics
Education Kits
Opto-mechanics
Light Sources
Experimental Instruments
Photonics Components
Diffractive Micro-optics



Experimental Instruments » SGC-1A Ellipsometer

Introduction

This is a manually experimental demonstrator of Ellipsometer. An input beam of random polarization is firstly transferred to a linear polarized beam by passing a polarizer. It is then transferred to an elliptical polarized beam using a quarter wave plate and incidents on the film of the sample to be measured. The polarization status of the reflected beam from the film will be altered. The optical parameters, thickness and refractive indices, of the measured film can be calculated by the analysis of the polarization changes. Student will gain knowledge about working principle of Ellipsometer and grasp operation skills of the instrument.

ItemDescriptionQty
1 Ellipsometer Main Machine 1
2 He-Ne Laser 1
3 Photo-electric Amplifier 1
4 Photo Cell 1
5 Si02 Film on Si Sample 1
6 Application Program 1
7 Manual 1

Specifications
Measurement Range 1 nm ~ 300 nm
Incident Angle 30° ~ 90°, Error ≤ 0.1°
Polarizer/Analyzer Angle Range 0° ~ 180°
Disk Angle Scale 2 degree/scale
Min. Reading of Vernier 0.05°
Optical Center Height 152 mm
Working Stage Diameter Φ50 mm

Back

 
 
Home Technologies About Us News Payment Contact Us
 
  Copyright 1997-2010 New Span Opto-Technology Inc. All rights reserved.