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XGS-1 Electronic Speckle Pattern Interferometry (ESPI) Experimental System
Introduction
Electronic speckle pattern interferometry (ESPI) is a method for studying object surface deformation. It involves techniques of computing image processing and holographic interferometry.
Specifications
Main Components
- He-Ne Laser w/power supply: 1
- SZ-04 Magnetic Base w/post holder: 7
- SZ-02 2-D Adjustable Stage: 3
- SZ-11 Small 2-D stage: 1
- SZ-07 2-D Tiltable Holder: 5
- SZ-12 Plate Holder: 2
- SZ-04 SZ-42 Laser Tube Holder: 1
- SZ-04 SZ-13 White Screen: 1
- SZ-04 Flat Mirror: 3
- SZ-04 Beam Expander (f =4.5 mm): 1
- SZ-04 Beam Splitter (6:4, 60x50x6.3 mm): 1
- SZ-04 Lens (f =70 mm): 1
- SZ-04 Mtested Object 1 w/power supply: 1
- SZ-04 tested Object 2: 1
- B/W CCD w/power supply: 1
- Image Card: 1
- Application Program and Manual: 1
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